MATL 471/871: Electron Microscopy of Materials

Prereqs: PHYS 212.
Introduction to electron beam instruments. Electron interactions with materials. Basic aspects of electron diffraction, image formation and spectrum generation by materials. Acquisition and analysis of images, diffraction patterns and spectral data. Resolution and sensitivity limits of electron probe methods. Practical experience in the use of electron microscopes for characterization of materials.
Credit Hours: 3
Course Delivery: Classroom

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